Direct Measurement of Lateral Force Using Dual Cantilevers
نویسندگان
چکیده
منابع مشابه
Direct Measurement of Lateral Force Using Dual Cantilevers
We have constructed an experimental system to measure a piconewton lateral force using dual cantilevers which cross with each other. The resolution of the lateral force is estimated to be 3.3 p ± 0.2 pN, which is comparable to forces due to thermal fluctuation. This experimental apparatus works so easily that it will enable us to determine forces during nano-manipulation and nano-tribological m...
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V-shaped cantilevers are used widely in the atomic force microscope ~AFM! due to their perceived enhanced resistance to lateral forces in comparison to rectangular cantilevers. In this article, we rigorously investigate this premise, and in so doing establish that, contrary to established operating principles and intuition, V-shaped AFM cantilevers are generally more prone to the effects of lat...
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The combination of ultrasound with atomic force microscopy (AFM) opens the high lateral resolution of scanning probe techniques to ultrasonics. Atomic force acoustic microscopy (AFAM) and lateral atomic force acoustic microscopy are techniques which use the vibration modes of AFM cantilevers. In the AFAM-mode the cantilever is vibrating in one of its flexural resonances while the sensor tip is ...
متن کاملNote: Improved calibration of atomic force microscope cantilevers using multiple reference cantilevers.
Overall precision of the simplified calibration method in J. E. Sader et al., Rev. Sci. Instrum. 83, 103705 (2012), Sec. III D, is dominated by the spring constant of the reference cantilever. The question arises: How does one take measurements from multiple reference cantilevers, and combine these results, to improve uncertainty of the reference cantilever's spring constant and hence the overa...
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ژورنال
عنوان ژورنال: Sensors
سال: 2012
ISSN: 1424-8220
DOI: 10.3390/s120303200